Oxford’s CEO, David DiMayo, will be in Milwaukee, WI on July 14th and 15th. If you have clients who would like to meet with David while he is in town, please contact us at 410.472.6490... read more
Category: Oxford in the News
Oxford’s CEO Travels to Boston, MA
Oxford’s CEO, David DiMayo, is traveling Boston, MA on July 6th through the 7th. If you have clients who would like to meet with David while he is in town, please contact his assistant, Serra... read more
Oxford’s CEO Travels to Manassas, VA on June 23rd
Oxford’s CEO, David DiMayo, is traveling to Manassas, VA on June 23rd. If you have clients who would like to meet with David while he is in town, please contact his assistant, Serra Berry, at... read more
Oxford’s President of Sales Travels to Memphis, TN from June 23rd-25th
Oxford’s President of Sales, Geoff Heyl, is traveling to Memphis, TN from June 13th-15th. If you have clients or advisors in the area who would like to meet with Geoff while he is in town,... read more
Oxford’s CEO & Principal Travel to New York City on June 15th
Oxford’s CEO, David DiMayo, and Principal, Kevin Myers, will be in New York City from June 15th through the 17th. If you have clients who would like to meet with David while he is in... read more
Oxford Team Members Earn ACI Designation
Oxford Risk Management Group would like to congratulate the following team members for earning the Associate in Captive Insurance (ACI) designation: Mike DiMayo, Principal David DiMayo, CEO Ashley DiMayo, COO Geoff Heyl, President of Sales... read more
Oxford’s Vice President of Sales Travels to California the week of May 16th
Oxford’s Vice President of Sales, David Ginsberg, is traveling to California on May 16th. David will be in the Sacramento area May 16th & 17th and in the Los Angeles area on May 19th and... read more...
Oxford’s CEO Travels to New Orleans, LA May 16 & 17th
Oxford’s CEO, David DiMayo, will be in New Orleans, LA on May 16th and 17th. If you have clients who would like to meet with David while he is in town, please contact us at... read more